Nouvelle Kratos AXIS Nova à Europe
Nouvelle
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Specifications
- Condition
- nouvelle
- Catégorie
- L'imagerie médicale
- Sous-catégorie
- Analyses de surface
- Sous-catégorie 2
- X-ray photoelectron spectrometer (xps)
- Sous-catégorie 3
- Imaging x-ray photoelectron spectrometer
- Listing ID
- 96703320
Description
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
State-of-the-art performance
Designed for ease of use, the AXIS Nova has automated sample loading, orthogonal cameras for easy sample positioning and intuitive data acquisition software. A unique design of the AXIS Nova is the 110mm diameter sample platen allowing unrivalled large sample handling and high sample throughput. None of these attributes compromise the market-leading performance.





